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[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits

✍ Scribed by Dhillon, Y.S.; Diril, A.U.; Chatterjee, A.

Book ID: 118031880
Publisher: IEEE
Year: 2005
Weight: 202 KB
Volume: 0
Category: Article
DOI: 10.1109/date.2005.274

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Ultra-wideband (UWB) communication is an emerging wireless technology that promises high data rates over short distances and precise locationing. The large available bandwidth and the constraint of a maximum power spectral density drives a unique set of system challenges. This paper addresses these