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[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Smart Temperature Sensor for Thermal Testing of Cell-Based ICs

✍ Scribed by Bota, S.A.; Rosales, M.; Rossello, J.L.; Segura, J.

Book ID: 120814358
Publisher: IEEE
Year: 2005
Weight: 134 KB
Category: Article
DOI: 10.1109/DATE.2005.271

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