✦ LIBER ✦

[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Leakage-Aware Interconnect for On-Chip Network

✍ Scribed by Yuh-Fang Tsai, ; Narayaynan, V.; Yuan Xie, ; Irwin, M.J.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Design, Automation and Test in Eur

✍ Genko, N.; Atienza, D.; De Micheli, G.; Mendias, J.M.; Hermida, R.; Catthoor, F. 📂 Article 📅 2005 🏛 IEEE ⚖ 252 KB

[IEEE Design, Automation and Test in Eur

✍ Link, G.M.; Vijaykrishnan, N. 📂 Article 📅 2005 🏛 IEEE ⚖ 85 KB

[IEEE Design, Automation and Test in Eur

✍ Heinecke, H. 📂 Article 📅 2005 🏛 IEEE ⚖ 95 KB

[IEEE Design, Automation and Test in Eur

✍ Kukkala, P.; Riihimaki, J.; Hannikainen, M.; Hamalainen, T.D.; Kronlof, K. 📂 Article 📅 2005 🏛 IEEE ⚖ 147 KB

[IEEE Design, Automation and Test in Eur

✍ Stergiou, S.; Angiolini, F.; Carta, S.; Raffo, L.; Bertozzi, D.; De Micheli, G. 📂 Article 📅 2005 🏛 IEEE ⚖ 146 KB

[IEEE Design, Automation and Test in Eur

✍ Blazquez, R.; Lee, F.; Wentzloff, D.; Ginsburg, B.; Powell, J.; Chandrakasan, A. 📂 Article 📅 2005 🏛 IEEE ⚖ 142 KB