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[IEEE Conference Record of the 2006 IEEE International Symposium on Electrical Insulation - Toronto, ON, Canada (11-14 June 2006)] Conference Record of the 2006 IEEE International Symposium on Electrical Insulation - Comparisons of Discrete Wavelet Transform, Wavelet Packet Transform and Stationary Wavelet Transform in Denoising PD Measurement Data

✍ Scribed by Zhou, X.; Zhou, C.; Stewart, B.G.

Book ID: 126836698
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 276 KB
Category: Article
ISBN-13: 9781424403332
DOI: 10.1109/elinsl.2006.1665301

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