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[IEEE Conference Record of the 2002 IEEE International Symposium on Electrical Insulation - Boston, MA, USA (7-10 April 2002)] Conference Record of the the 2002 IEEE International Symposium on Electrical Insulation (Cat. No.02CH37316) - New aging diagnostics for microdischarge assessment of high dV/dt stressed mica paper capacitors

✍ Scribed by Gill, H.M.; Doney, R.L.; Althoff, E.K.; Sarjeant, W.J.

Book ID: 118060398
Publisher: IEEE
Year: 2002
Weight: 368 KB
Volume: 0
Category: Article
ISBN-13: 9780780373372
DOI: 10.1109/elinsl.2002.995943

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