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[IEEE Conference Record of the 2002 IEEE International Symposium on Electrical Insulation - Boston, MA, USA (7-10 April 2002)] Conference Record of the the 2002 IEEE International Symposium on Electrical Insulation (Cat. No.02CH37316) - Reliability assessment of polymeric insulators by the combined aging test

✍ Scribed by Jae Hong Han, ; Byung Sung Lee, ; Dong Myung Kim,

Book ID: 126748106
Publisher: IEEE
Year: 2002
Weight: 406 KB
Category: Article
ISBN-13: 9780780373372
DOI: 10.1109/ELINSL.2002.995918

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