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[IEEE Conference Record of the 2000 IEEE International Symposium on Electrical Insulation - Anaheim, CA, USA (2-5 April 2000)] Conference Record of the 2000 IEEE International Symposium on Electrical Insulation (Cat. No.00CH37075) - Accelerated aging and diagnostic testing of 115 kV Type U bushings

✍ Scribed by Braun, J.M.; Densley, R.J.; Sedding, H.G.; Biksa, V.; Yung, C.; Bialek, T.; Nothelfer, A.; Sharp, R.

Book ID: 123620706
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 552 KB
Edition: 1
Category: Article
ISBN-13: 9780780359314
DOI: 10.1109/ELINSL.2000.845550

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