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[IEEE Conference Record of the 2000 IEEE International Symposium on Electrical Insulation - Anaheim, CA, USA (2-5 April 2000)] Conference Record of the 2000 IEEE International Symposium on Electrical Insulation (Cat. No.00CH37075) - Influence of high DC electrical fields on some aging properties of XLPE

✍ Scribed by Crine, J.-P.

Book ID: 127268100
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 312 KB
Edition: 1
Category: Article
ISBN-13: 9780780359314
DOI: 10.1109/elinsl.2000.845456

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