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[IEEE Conference Record of the 1996 IEEE International Symposium on Electrical Insulation - Montreal, Que., Canada (16-19 June 1996)] Conference Record of the 1996 IEEE International Symposium on Electrical Insulation - The effect of thickness and area on the electric strength of thin dielectric films

✍ Scribed by Yilmaz, G.; Kalenderli, O.

Book ID: 125473576
Publisher: IEEE
Year: 1996
Tongue: English
Weight: 314 KB
Volume: 2
Category: Article
ISBN-13: 9780780335318
DOI: 10.1109/elinsl.1996.549386

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