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[IEEE Conference Record of the 1996 IEEE International Symposium on Electrical Insulation - Montreal, Que., Canada (16-19 June 1996)] Conference Record of the 1996 IEEE International Symposium on Electrical Insulation - Electrical aging of extruded dielectric cables: a physical model

✍ Scribed by Crine, J.-P.; Dang, C.; Parpal, J.-L.

Book ID: 126705820
Publisher: IEEE
Year: 1996
Tongue: English
Weight: 381 KB
Volume: 2
Category: Article
ISBN-13: 9780780335318
DOI: 10.1109/ELINSL.1996.549428

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