๐”– Bobbio Scriptorium
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[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - Overcoming Post-Silicon Validation Challenges through Quick Error Detection (QED)

โœ Scribed by Lin, David; Hong, Ted; Li, Yanjing; Fallah, Farzan; Gardner, Donald S.; Hakim, Nagib; Mitra, Subhasish


Book ID
121315789
Publisher
IEEE Conference Publications
Year
2013
Weight
542 KB
Category
Article
ISBN
1467350710

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