[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - Capturing Post-Silicon Variation by Layout-aware Path-delay Testing

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✍ Carretero, Javier; Herrero, Enric; Monchiero, Matteo; Ramirez, Tanausu; Vera, Xa 📂 Article 📅 2013 🏛 IEEE Conference Publications ⚖ 860 KB

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✍ Le, Hoang M.; Grosse, Daniel; Drechsler, Rolf 📂 Article 📅 2013 🏛 IEEE Conference Publications ⚖ 137 KB

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✍ Lin, David; Hong, Ted; Li, Yanjing; Fallah, Farzan; Gardner, Donald S.; Hakim, N 📂 Article 📅 2013 🏛 IEEE Conference Publications ⚖ 542 KB

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✍ Cilardo, Alessandro; Gallo, Luca; Mazzeo, Antonino; Mazzocca, Nicola 📂 Article 📅 2013 🏛 IEEE Conference Publications ⚖ 175 KB

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✍ Li, Jiaxin; Zhang, Weihua; Chen, Haibo; Zang, Binyu 📂 Article 📅 2013 🏛 IEEE Conference Publications ⚖ 175 KB

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✍ Kozyrakis, Christos 📂 Article 📅 2013 🏛 IEEE Conference Publications ⚖ 803 KB