[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - A SPICE-Compatible Model of Graphene Nano-Ribbon Field-Effect Transistors Enabling Circuit-Level Delay and Power Analysis under Process Variation

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✍ Li, Jiaxin; Zhang, Weihua; Chen, Haibo; Zang, Binyu 📂 Article 📅 2013 🏛 IEEE Conference Publications ⚖ 175 KB

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✍ Cilardo, Alessandro; Gallo, Luca; Mazzeo, Antonino; Mazzocca, Nicola 📂 Article 📅 2013 🏛 IEEE Conference Publications ⚖ 175 KB

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✍ Carretero, Javier; Herrero, Enric; Monchiero, Matteo; Ramirez, Tanausu; Vera, Xa 📂 Article 📅 2013 🏛 IEEE Conference Publications ⚖ 860 KB

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✍ Chen, Yuankai; Zhou, Hai 📂 Article 📅 2013 🏛 IEEE Conference Publications ⚖ 253 KB

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✍ Zhang, Xiaolin; Ye, Jing; Hu, Yu; Li, Xiaowei 📂 Article 📅 2013 🏛 IEEE Conference Publications ⚖ 292 KB

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✍ Wille, Robert; Gogolla, Martin; Soeken, Mathias; Kuhlmann, Mirco; Drechsler, Rol 📂 Article 📅 2013 🏛 IEEE Conference Publications ⚖ 162 KB