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[IEEE Conference on Precision Electromagnetic: Measurements - Washington, DC, USA (6-10 July 1998)] 1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) - Critical aspects of scanning X-ray/optical interferometry

✍ Scribed by Bergamin, A.; Cavagnero, G.; Mana, G.; Zosi, G.

Book ID: 120033752
Publisher: IEEE
Year: 1998
Weight: 214 KB
Category: Article
ISBN-13: 9780780350182
DOI: 10.1109/CPEM.1998.699962

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