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[IEEE Conference on Precision Electromagnetic: Measurements - Washington, DC, USA (6-10 July 1998)] 1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) - Metrological analysis of a high current measurement system

✍ Scribed by Prat, M.; Desanlis, T.

Book ID: 118198370
Publisher: IEEE
Year: 1998
Weight: 191 KB
Volume: 0
Category: Article
ISBN-13: 9780780350182
DOI: 10.1109/cpem.1998.699951

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