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[IEEE Comput. Soc. Press Proceedings. 'Meeting the Tests of Time'., International Test Conference - Washington, DC, USA (29-31 Aug. 1989)] Proceedings. 'Meeting the Tests of Time'., International Test Conference - An analysis of tungsten probes' effect on yield in a production wafer probe environment

✍ Scribed by Nadeau, N.; Perreault, S.

Book ID: 126728444
Publisher: IEEE Comput. Soc. Press
Year: 1989
Weight: 638 KB
Category: Article
DOI: 10.1109/TEST.1989.82296

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