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[IEEE Comput. Soc. Press Proceedings. 'Meeting the Tests of Time'., International Test Conference - Washington, DC, USA (29-31 Aug. 1989)] Proceedings. 'Meeting the Tests of Time'., International Test Conference - Fast automatic failbit analysis for DRAMs

✍ Scribed by Malzfeldt, W.; Mohr, W.; Oberle, H.-D.; Kodalle, K.

Book ID: 126626028
Publisher: IEEE Comput. Soc. Press
Year: 1989
Weight: 391 KB
Category: Article
DOI: 10.1109/TEST.1989.82326

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