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[IEEE Comput. Soc. Press Proceedings. 'Meeting the Tests of Time'., International Test Conference - Washington, DC, USA (29-31 Aug. 1989)] Proceedings. 'Meeting the Tests of Time'., International Test Conference - Custom pin electronics for VLSI automatic test equipment

✍ Scribed by Bryson, S.W.

Book ID: 120574207
Publisher: IEEE Comput. Soc. Press
Year: 1989
Weight: 389 KB
Category: Article
DOI: 10.1109/TEST.1989.82375

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