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[IEEE Comput. Soc. Press Proceedings. 'Meeting the Tests of Time'., International Test Conference - Washington, DC, USA (29-31 Aug. 1989)] Proceedings. 'Meeting the Tests of Time'., International Test Conference - Testability analysis of synchronous sequential circuits based on structural data

✍ Scribed by Hudli, R.V.; Seth, S.C.

Book ID: 115443101
Publisher: IEEE Comput. Soc. Press
Year: 1989
Weight: 602 KB
Volume: 0
Category: Article
DOI: 10.1109/test.1989.82320

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