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[IEEE Comput. Soc. Press IEEE 3rd Asian Test Symposium (ATS) - Nara, Japan (15-17 Nov. 1994)] Proceedings of IEEE 3rd Asian Test Symposium (ATS) - Evaluations of various TPG circuits for use in two-pattern testing

✍ Scribed by Furuya, K.; Yamazaki, S.; Sato, M.

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