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[IEEE Comput. Soc. Press 1993 International Conference on Computer Aided Design (ICCAD) - Santa Clara, CA, USA (7-11 Nov. 1993)] Proceedings of 1993 International Conference on Computer Aided Design (ICCAD) - Fault behavior dictionary for simulation of device-level transients

✍ Scribed by Choi, G.S.; Iyer, R.K.; Saab, D.G.

Book ID: 126689810
Publisher: IEEE Comput. Soc. Press
Year: 1993
Weight: 443 KB
Category: Article
ISBN-13: 9780818644900
DOI: 10.1109/ICCAD.1993.580023

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