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[IEEE Comput. Soc. Press 1993 International Conference on Computer Aided Design (ICCAD) - Santa Clara, CA, USA (7-11 Nov. 1993)] Proceedings of 1993 International Conference on Computer Aided Design (ICCAD) - Logic partitioning to pseudo-exhaustive test for BIST design

✍ Scribed by Chen, C.-I.; Yuen, J.

Book ID: 127244062
Publisher: IEEE Comput. Soc. Press
Year: 1993
Weight: 443 KB
Category: Article
ISBN-13: 9780818644900
DOI: 10.1109/iccad.1993.580154

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