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[IEEE Comput. Soc. Press 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems - Venice, Italy (27-29 Oct. 1993)] Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems - Design of self-parity combinational circuits for self-testing and on-line detection

✍ Scribed by Sogomonjan, E.S.; Goessel, M.

Book ID: 126737563
Publisher: IEEE Comput. Soc. Press
Year: 1993
Weight: 442 KB
Category: Article
ISBN-13: 9780818635021
DOI: 10.1109/DFTVS.1993.595814

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