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[IEEE Comput. Soc. Press 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems - Venice, Italy (27-29 Oct. 1993)] Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems - Design and implementation of a merged on-line and off-line self-testable architecture

โœ Scribed by Sun, X.; Serra, M.


Book ID
126662154
Publisher
IEEE Comput. Soc. Press
Year
1993
Weight
395 KB
Category
Article
ISBN-13
9780818635021

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