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[IEEE Comput. Soc. Press 1992 IEEE International Conference on Computer Design: VLSI in Computers & Processors - Cambridge, MA, USA (11-14 Oct. 1992)] Proceedings 1992 IEEE International Conference on Computer Design: VLSI in Computers & Processors - Identification of single gate delay fault redundancies

✍ Scribed by Brand, D.; Iyengar, V.S.

Book ID: 126757344
Publisher: IEEE Comput. Soc. Press
Year: 1992
Weight: 477 KB
Category: Article
ISBN-13: 9780818631108
DOI: 10.1109/ICCD.1992.276213

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