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[IEEE Comput. Soc. Press 1992 IEEE International Conference on Computer Design: VLSI in Computers & Processors - Cambridge, MA, USA (11-14 Oct. 1992)] Proceedings 1992 IEEE International Conference on Computer Design: VLSI in Computers & Processors - BIST generators for sequential faults

✍ Scribed by Zhang, S.; Byrne, R.; Miller, D.M.

Book ID: 125840315
Publisher: IEEE Comput. Soc. Press
Year: 1992
Tongue: English
Weight: 425 KB
Category: Article
ISBN-13: 9780818631108
DOI: 10.1109/ICCD.1992.276264

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