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[IEEE Comput. Soc. Press 1992 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Champaign, IL, USA (15-18 June 1992)] Proceedings 1992 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - A measure of symmetry based on shape similarity

✍ Scribed by Zabrodsky, H.; Peleg, S.; Avnir, D.

Book ID: 120647307
Publisher: IEEE Comput. Soc. Press
Year: 1992
Tongue: English
Weight: 328 KB
Category: Article
ISBN-13: 9780818628559
DOI: 10.1109/CVPR.1992.223196

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