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[IEEE Comput. Soc. Press 1992 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Champaign, IL, USA (15-18 June 1992)] Proceedings 1992 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Iterative TIN generation from digital evaluation models

✍ Scribed by Polis, M.F.; McKeown, D.M.

Book ID: 120555777
Publisher: IEEE Comput. Soc. Press
Year: 1992
Tongue: English
Weight: 774 KB
Category: Article
ISBN-13: 9780818628559
DOI: 10.1109/CVPR.1992.223172

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