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[IEEE Comput. Soc. Press 13th IEEE VLSI Test Symposium - Princeton, NJ, USA (30 April-3 May 1995)] Proceedings 13th IEEE VLSI Test Symposium - On the application of local circuit transformations with special emphasis on path delay fault testability

✍ Scribed by Hengster, H.; Drechsler, R.; Becker, B.

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