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[IEEE Comput. Soc. Press 13th IEEE VLSI Test Symposium - Princeton, NJ, USA (30 April-3 May 1995)] Proceedings 13th IEEE VLSI Test Symposium - Frequency-based BIST for analog circuit testing

✍ Scribed by Khaled, S.; Kaminska, B.; Courtois, B.; Lubaszewski, M.

No coin nor oath required. For personal study only.

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