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[IEEE Comput. Soc Ninth Asian Test Symposium - Taipei, Taiwan (4-6 Dec. 2000)] Proceedings of the Ninth Asian Test Symposium - Peak-power reduction for multiple-scan circuits during test application

✍ Scribed by Kuen-Jong Lee, ; Tsung-Chu Haung, ; Jih-Jeen Chen,

Book ID: 127155757
Publisher: IEEE Comput. Soc
Year: 2000
Weight: 602 KB
Category: Article
ISBN-13: 9780769508870
DOI: 10.1109/ats.2000.893666

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