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[IEEE Comput. Soc Meeting on Design Automation and Test in Europe - Paris, France (27-30 March 2000)] Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537) - A BIST scheme for on-chip ADC and DAC testing

โœ Scribed by Jiun-Lang Huang, ; Chee-Kian Ong, ; Kwang-Ting Cheng,


Book ID
120880078
Publisher
IEEE Comput. Soc
Year
2000
Tongue
English
Weight
88 KB
Category
Article
ISBN-13
9780769505374

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