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[IEEE Comput. Soc IEEE 2000 1st International Symposium on Quality Electronic Design - San Jose, CA, USA (20-22 March 2000)] Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) - Peak power reduction in low power BIST

✍ Scribed by Xiaodeng Zhang, ; Roy, K.

Book ID: 115531331
Publisher: IEEE Comput. Soc
Year: 2000
Weight: 232 KB
Volume: 0
Category: Article
ISBN-13: 9780769505251
DOI: 10.1109/isqed.2000.838911

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