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[IEEE Comput. Soc HASE 2000. 5th IEEE International Symposium on High-Assurance Systems Engineering - Albuquerque, NM, USA (15-17 Nov. 2000)] Proceedings. Fifth IEEE International Symposium on High Assurance Systems Engineering (HASE 2000) - On the sensitivity of NMR unreliability to non-exponential repair distributions

✍ Scribed by Kieckhafer, R.M.; Azadmanesh, M.H.; Hui, Y.

Book ID: 126705219
Publisher: IEEE Comput. Soc
Year: 2000
Weight: 582 KB
Category: Article
ISBN-13: 9780769509273
DOI: 10.1109/HASE.2000.895474

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