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[IEEE Comput. Soc HASE 99: Fourth IEEE International Symposium on High Assurance Systems Engineering - Washington, DC, USA (17-19 Nov. 1999)] Proceedings 4th IEEE International Symposium on High-Assurance Systems Engineering - Lessons from 342 medical device failures

✍ Scribed by Wallace, D.R.; Kuhn, D.R.

Book ID: 126629433
Publisher: IEEE Comput. Soc
Year: 1999
Weight: 79 KB
Category: Article
ISBN-13: 9780769504186
DOI: 10.1109/HASE.1999.809487

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