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[IEEE Comput. Soc First IEEE International Workshop on Electronic Design, Test and Applications '2002 - Christchurch, New Zealand (29-31 Jan. 2002)] Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002 - Address and data scrambling: causes and impact on memory tests

✍ Scribed by van de Goor, A.J.; Schanstra, I.

Book ID: 125484478
Publisher: IEEE Comput. Soc
Year: 2002
Tongue: English
Weight: 421 KB
Edition: 2002 ed.
Category: Article
ISBN-13: 9780769514536
DOI: 10.1109/DELTA.2002.994601

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