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[IEEE Comput. Soc First IEEE International Workshop on Electronic Design, Test and Applications '2002 - Christchurch, New Zealand (29-31 Jan. 2002)] Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002 - European network for test education

✍ Scribed by Bertrand, Y.; Flottes, M.-L.; Azais, F.; Bernard, S.; Latorre, L.; Lorival, R.

Book ID: 126755433
Publisher: IEEE Comput. Soc
Year: 2002
Weight: 274 KB
Category: Article
ISBN-13: 9780769514536
DOI: 10.1109/DELTA.2002.994620

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