[IEEE Comput. Soc Eighth Asian Test Symposium - Shanghai, China (16-18 Nov. 1999)] Proceedings Eighth Asian Test Symposium (ATS'99) - Failure analysis case studies using the IR-OBIRCH (infrared optical beam induced resistance change) method

✍ Scribed by Nikawa, K.; Inoue, S.; Morimoto, K.; Sone, S.

• Book ID: 126597433
• Publisher: IEEE Comput. Soc
• Year: 1999
• Weight: 341 KB
• Category: Article
• ISBN-13: 9780769503158
• DOI: 10.1109/ATS.1999.810781