[IEEE Comput. Soc . Design, Automation and Test in Europe Conference and Exhibition - Paris, France (16-20 Feb. 2004)] Proceedings Design, Automation and Test in Europe Conference and Exhibition - Evaluating the effects of SEUs affecting the configuration memory of an SRAM-based FPGA

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✍ Posadas, H.; Herrera, F.; Sanchez, P.; Villar, E.; Blasco, F. 📂 Article 📅 2004 🏛 IEEE Comput. Soc 🌐 English ⚖ 253 KB

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