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[IEEE Asia and South Pacific Conference on Design Automation, 2006. - Yokohama, Japan (Jan. 24, 2006)] Asia and South Pacific Conference on Design Automation, 2006. - Analysis and optimization of gate leakage current of power gating circuits

✍ Scribed by Hyung-Ock Kim, ; Youngsoo Shin,

Book ID: 126709222
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 168 KB
Category: Article
ISBN-13: 9780780394513
DOI: 10.1109/ASPDAC.2006.1594745

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