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[IEEE Annual Reliability and Maintainability. Symposium. 1999 Proceedings (Cat. No.99CH36283) - Washington, DC, USA (1999.01.18-1999.01.21)] Annual Reliability and Maintainability. Symposium. 1999 Proceedings (Cat. No.99CH36283) - Bayesian analysis for system reliability inferences

✍ Scribed by Tran, T.H.; Murdock, W.P.; Pohl, E.A.

Book ID: 121680700
Publisher: IEEE
Year: 1999
Weight: 623 KB
Category: Article
ISBN-13: 9780780351431
DOI: 10.1109/rams.1999.744111

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