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[IEEE Annual Reliability and Maintainability. Symposium. 1999 Proceedings (Cat. No.99CH36283) - Washington, DC, USA (1999.01.18-1999.01.21)] Annual Reliability and Maintainability. Symposium. 1999 Proceedings (Cat. No.99CH36283) - A framework of integrated reliability demonstration in system development

✍ Scribed by Hsieh, P.I.; Ling, J.

Book ID: 120595536
Publisher: IEEE
Year: 1999
Weight: 689 KB
Category: Article
ISBN-13: 9780780351431
DOI: 10.1109/RAMS.1999.744128

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