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[IEEE Annual Reliability and Maintainability Symposium. 1998 Proceedings. International Symposium on Product Quality and Integrity - Anaheim, CA, USA (19-22 Jan. 1998)] Annual Reliability and Maintainability Symposium. 1998 Proceedings. International Symposium on Product Quality and Integrity - Parameter estimation for mixed-Weibull distribution

✍ Scribed by Kececioglu, D.B.; Wendai Wang,

Book ID: 121081320
Publisher: IEEE
Year: 1998
Weight: 527 KB
Category: Article
ISBN-13: 9780780343627
DOI: 10.1109/RAMS.1998.653782

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