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[IEEE amp; Management Symposium (SEMI-THERM) - Santa Clara, CA (2010.02.21-2010.02.25)] 2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - PTAT sensor for chip overheat protection

✍ Scribed by Szermer, Michal; Janicki, Marcin; Pietrzak, Piotr; Kulesza, Zbigniew; Napieralski, Andrzej

Book ID: 121301822
Publisher: IEEE
Year: 2010
Weight: 296 KB
Category: Article
ISBN: 1424494583
DOI: 10.1109/STHERM.2010.5444294

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