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[IEEE amp; Management Symposium (SEMI-THERM) - Santa Clara, CA (2010.02.21-2010.02.25)] 2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - The junction-to-case thermal resistance: A boundary condition dependent thermal metric

✍ Scribed by Schweitzer, Dirk

Book ID: 120211902
Publisher: IEEE
Year: 2010
Weight: 333 KB
Category: Article
ISBN: 1424494583
DOI: 10.1109/STHERM.2010.5444298

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