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[IEEE 9th International Symposium on Power Semiconductor Devices and IC's - Weimar, Germany (26-29 May 1997)] Proceedings of 9th International Symposium on Power Semiconductor Devices and IC's - Non-destructive evaluation of the circuit-dependent turn-off limits of gate turn-off thyristors by the detection of the local current density

✍ Scribed by Metzner, D.; Otto, J.; Schulze, H.-J.

Book ID: 127148138
Publisher: IEEE
Year: 1997
Weight: 448 KB
Edition: 1997
Category: Article
ISBN-13: 9780780339934
DOI: 10.1109/ispsd.1997.601438

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