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[IEEE 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - Beijing, China (Oct. 18-21, 2004)] Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - CMOS transistor mismatch model with temperature effect for HSPICE and SPECTRE

✍ Scribed by Philip Beow Yew Tan, ; Albert Victor Kordesch, ; Othman Sidek,

Book ID: 118179576
Publisher: IEEE
Year: 2004
Weight: 829 KB
Volume: 2
Category: Article
ISBN-13: 9780780385115
DOI: 10.1109/icsict.2004.1436718

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