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[IEEE 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - Beijing, China (Oct. 18-21, 2004)] Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - Characterization and modeling of a step-gate-oxide MOSFET for RF power amplifiers

✍ Scribed by Shuo Jia, ; Tsui, K.K.P.; Xiaoping Liao, ; Chen, K.J.

Book ID: 118001710
Publisher: IEEE
Year: 2004
Weight: 731 KB
Volume: 1
Category: Article
ISBN-13: 9780780385115
DOI: 10.1109/icsict.2004.1435023

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