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[IEEE 7th IEEE Conference on Instrumentation and Measurement Technology - San Jose, CA, USA (13-15 Feb. 1990)] 7th IEEE Conference on Instrumentation and Measurement Technology - How good is your calibration? A post-mortem examination and recalibration

✍ Scribed by Aguilera, J.; Fisher, B.

Book ID: 126612624
Publisher: IEEE
Year: 1990
Weight: 34 KB
Category: Article
DOI: 10.1109/IMTC.1990.65995

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