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[IEEE 7th IEEE Conference on Instrumentation and Measurement Technology - San Jose, CA, USA (13-15 Feb. 1990)] 7th IEEE Conference on Instrumentation and Measurement Technology - Measurement of frequency response functions in noisy environments

✍ Scribed by Schoukens, J.; Pintelon, R.

Book ID: 126633845
Publisher: IEEE
Year: 1990
Weight: 327 KB
Category: Article
DOI: 10.1109/IMTC.1990.66040

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